2.6 Time-Dependent Sensitivity Changes
During Cycle 17 the throughputs of some COS modes—the bare-aluminum NUV G225M and G285M gratings and the FUV channels—were found to be declining with time significantly more rapidly than had been expected. Since that time the decline of the G225M and G285M grating throughputs has continued at approximately the same rate. However, the rate of decline of the throughput of the FUV channels has fluctuated, first becoming more modest and later showing variations that appear to be correlated with Solar activity (Section 5.1.5). It is believed that these latter changes are due to degradation of the photocathode caused by reactions with residual atmospheric atomic oxygen. As Solar activity increases, the Earth's atmosphere becomes slightly inflated, exposing the open-faced COS FUV XDL detector to increased levels of atomic oxygen.
Despite the decline with time, the sensitivity of the COS FUV channel remains outstanding, and it remains the instrument of choice for observing faint FUV targets.
It is strongly recommended that observers use the COS Exposure Time Calculator (ETC; see Chapter 7) to estimate the required exposure times for their proposals. The ETC calculations account for the time-dependent sensitivities by using the same model as the calibration pipeline. The sensitivities used by the ETC for each cycle correspond to various values extrapolated to the mid-cycle date and will provide sufficient accuracy over the whole cycle for the purposes of an observing proposal.
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COS Instrument Handbook
- Acknowledgments
- Chapter 1: An Introduction to COS
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Chapter 2: Special Considerations when Observing with COS
- • 2.1 COS FUV Detector Lifetime Positions
- • 2.2 Visit Length
- • 2.3 Central Wavelength Settings Added in Cycle 26
- • 2.4 ORIENT constraints for Extended Sources
- • 2.5 COS Observations Below 1150 Angstroms: Resolution and Wavelength Calibration Issues
- • 2.6 Time-Dependent Sensitivity Changes
- • 2.7 Spectroscopic Use of the Bright Object Aperture
- • 2.8 Non-Optimal Observing Scenarios
- • 2.9 NUV Spectroscopic Acquisitions
- • 2.10 SNAP, TOO, and Unpredictable Source Programs with COS
- • 2.11 Choosing between COS and STIS
- Chapter 3: Description and Performance of the COS Optics
- Chapter 4: Description and Performance of the COS Detectors
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Chapter 5: Spectroscopy with COS
- • 5.1 The Capabilities of COS
- • 5.2 TIME-TAG vs. ACCUM Mode
- • 5.3 Valid Exposure Times
- • 5.4 Estimating the BUFFER-TIME in TIME-TAG Mode
- • 5.5 Spanning the Gap with Multiple CENWAVE Settings
- • 5.6 FUV Single-Segment Observations
- • 5.7 Internal Wavelength Calibration Exposures
- • 5.8 Fixed-Pattern Noise
- • 5.9 COS Spectroscopy of Extended Sources
- • 5.10 Wavelength Settings and Ranges
- • 5.11 Spectroscopy with Available but Unsupported Settings
- Chapter 6: Imaging with COS
- Chapter 7: Exposure-Time Calculator - ETC
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Chapter 8: Target Acquisitions
- • 8.1 Introduction
- • 8.2 Target Acquisition Overview
- • 8.3 ACQ SEARCH Acquisition Mode
- • 8.4 ACQ IMAGE Acquisition Mode
- • 8.5 ACQ PEAKXD Acquisition Mode
- • 8.6 ACQ PEAKD Acquisition Mode
- • 8.7 Exposure Times
- • 8.8 Centering Accuracy and Data Quality
- • 8.9 Recommended Parameters for all COS TA Modes
- • 8.10 Special Cases
- Chapter 9: Scheduling Observations
- Chapter 10: Bright-Object Protection
- Chapter 11: Data Products and Data Reduction
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Chapter 12: The COS Calibration Program
- • 12.1 Introduction
- • 12.2 Ground Testing and Calibration
- • 12.3 SMOV4 Testing and Calibration
- • 12.4 COS Monitoring Programs
- • 12.5 Cycle 17 Calibration Program
- • 12.6 Cycle 18 Calibration Program
- • 12.7 Cycle 19 Calibration Program
- • 12.8 Cycle 20 Calibration Program
- • 12.9 Cycle 21 Calibration Program
- • 12.10 Cycle 22 Calibration Program
- • 12.11 Cycle 23 Calibration Program
- • 12.12 Cycle 24 Calibration Program
- • 12.13 Cycle 25 Calibration Program
- • 12.14 Cycle 26 Calibration Program
- • 12.15 Cycle 27 Calibration Program
- • 12.16 Cycle 28 Calibration Program
- • 12.17 Cycle 29 Calibration Program
- Chapter 13: Spectroscopic Reference Material
- • Glossary