8.7 Exposure Times
While the figures in this section will help you to estimate exposure times for various acquisition scenarios, the COS Exposure Time Calculator (ETC) should be used for all proposal preparation.
8.7.1 Imaging Acquisitions
Acquisition images obtained through the PSA should strive for a minimum S/N of 20. Due to the complex shape of images obtained through the BOA, a S/N > 30 is recommended. For MIRRORB acquisitions, the recommended S/N refers only to the primary image; the ETC performs this calculation appropriately. Figure 8.3 shows approximate exposure times needed to reach these S/N levels for various target fluxes. A flat source spectrum (Fλ = constant) is assumed.
ACQ/IMAGE Acquisition.
8.7.2 Dispersed-Light Acquisitions
We recommend a minimum S/N of 40 for all dispersed-light acquisition exposures. STScI calibration programs routinely use up to S/N = 100 to minimize the influence of Poisson noise and background when very precise pointing is required. Figure 8.4 is a guide to the exposure time needed for a dispersed-light acquisition with the PSA, assuming a flat source spectrum (Fλ = constant). Note that these exposure times apply to each separate dwell point of a pattern, which is the quantity entered into APT in Phase II.
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COS Instrument Handbook
- Acknowledgments
- Chapter 1: An Introduction to COS
-
Chapter 2: Special Considerations for Cycle 28
- • 2.1 COS FUV Detector Lifetime Positions
- • 2.2 Central Wavelength Settings Added in Cycle 26
- • 2.3 Use of the G285M Grating is Discouraged
- • 2.4 COS Observations Below 1150 Angstroms: Resolution and Wavelength Calibration Issues
- • 2.5 Time-Dependent Sensitivity Changes
- • 2.6 Spectroscopic Use of the Bright Object Aperture
- • 2.7 Non-Optimal Observing Scenarios
- • 2.8 NUV Spectroscopic Acquisitions
- • 2.9 SNAP, TOO, and Unpredictable Source Programs with COS
- • 2.10 Choosing between COS and STIS
- Chapter 3: Description and Performance of the COS Optics
- Chapter 4: Description and Performance of the COS Detectors
-
Chapter 5: Spectroscopy with COS
- • 5.1 The Capabilities of COS
- • 5.2 TIME-TAG vs. ACCUM Mode
- • 5.3 Valid Exposure Times
- • 5.4 Estimating the BUFFER-TIME in TIME-TAG Mode
- • 5.5 Spanning the Gap with Multiple CENWAVE Settings
- • 5.6 FUV Single-Segment Observations
- • 5.7 Internal Wavelength Calibration Exposures
- • 5.8 Fixed-Pattern Noise
- • 5.9 COS Spectroscopy of Extended Sources
- • 5.10 Wavelength Settings and Ranges
- Chapter 6: Imaging with COS
- Chapter 7: Exposure-Time Calculator - ETC
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Chapter 8: Target Acquisitions
- • 8.1 Introduction
- • 8.2 Target Acquisition Overview
- • 8.3 ACQ SEARCH Acquisition Mode
- • 8.4 ACQ IMAGE Acquisition Mode
- • 8.5 ACQ PEAKXD Acquisition Mode
- • 8.6 ACQ PEAKD Acquisition Mode
- • 8.7 Exposure Times
- • 8.8 Centering Accuracy and Data Quality
- • 8.9 Recommended Parameters for all COS TA Modes
- • 8.10 Special Cases
- Chapter 9: Scheduling Observations
- Chapter 10: Bright-Object Protection
- Chapter 11: Data Products and Data Reduction
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Chapter 12: The COS Calibration Program
- • 12.1 Introduction
- • 12.2 Ground Testing and Calibration
- • 12.3 SMOV4 Testing and Calibration
- • 12.4 COS Monitoring Programs
- • 12.5 Cycle 17 Calibration Program
- • 12.6 Cycle 18 Calibration Program
- • 12.7 Cycle 19 Calibration Program
- • 12.8 Cycle 20 Calibration Program
- • 12.9 Cycle 21 Calibration Program
- • 12.10 Cycle 22 Calibration Program
- • 12.11 Cycle 23 Calibration Program
- • 12.12 Cycle 24 Calibration Program
- • 12.13 Cycle 25 Calibration Program
- • 12.14 Cycle 26 Calibration Program
- • 12.15 Cycle 27 Calibration Program
- Chapter 13: Spectroscopic Reference Material
- • Glossary