52X0.1E1 and 52X0.1D1 Pseudo-Apertures

Description

These pseudo-apertures are the same physical aperture as the 52X0.1 aperture, but are used to place the target at different locations on the detectors to reduce CCD CTE loss (E1) or FUV-MAMA background (D1). The throughputs of the E1 and D1 apertures as a function of wavelength are similar to those of the corresponding regular positions. However, there is some vignetting of the gratings that changes the overall system throughput slightly with varying position along the slit. At the E1 positions, the overall low dispersion throughputs are decreased by 2 to 3%, while at the D1 position the G140L throughput is increased by 2 to 7%. Since these throughput changes depend on the grating and the position on the detector, they are handled in the pipeline calibration by the use of low-order flat fields (lfl files, only for the L-mode) rather than by a change in aperture throughput curve. Throughput changes for the medium resolution (M-mode) gratings are not well characterized, but should be similar. The usage of these slits is supported only for certain modes, as listed in the table below.

Special Considerations

Same special considerations as for the 52X0.1 aperture apply to these pseudo-apertures. See reference information on previous page.

Aperture	Detector	Allowed Gratings	Usage
`52X0.1E1`	`CCD`	All `CCD` gratings	Places the target at row ~900 to minimize CTE effects
`52X0.1D1`	`FUV-MAMA`	`G140L` & `G140M`	Places the target 2±1″ ≤ (`G140L`) or 4±1″ (`G140M`) above the bottom edge of `FUV-MAMA`; intended for observations of very faint targets where dark current contribution should be minimized

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STIS Instrument Handbook
- • Acknowledgments
- Chapter 1: Introduction
  - • 1.1 Overview
  - • 1.2 Introduction to the Handbook
  - • 1.3 Handbook Layout
  - • 1.4 Proposal Preparations and Observations with STIS
  - • 1.5 The Help Desk at STScI
  - • 1.6 The STIS Web Pages and Support Information
  - • 1.7 Non-proprietary STIS Data
- Chapter 2: Special Considerations for Cycle 32
  - • 2.1 STIS Repair and Return to Operations
  - • 2.2 Summary of STIS Performance Changes Since 2004
  - • 2.3 New Capabilities for Cycle 32
  - • 2.4 Use of Available-but-Unsupported Capabilities
  - • 2.5 Choosing Between COS and STIS
  - • 2.6 Scheduling Efficiency and Visit Orbit Limits
  - • 2.7 MAMA Scheduling Policies
  - • 2.8 Prime and Parallel Observing: MAMA Bright-Object Constraints
  - • 2.9 STIS Snapshot Program Policies
- Chapter 3: STIS Capabilities, Design, Operations, and Observations
  - • 3.1 Instrument Capabilities
  - • 3.2 Instrument Design
  - • 3.3 Basic Instrument Operations
  - • 3.4 Designing STIS Observations
- Chapter 4: Spectroscopy
  - • 4.1 Overview
  - • 4.2 First-Order Long-Slit Spectroscopy
  - • 4.3 Echelle Spectroscopy in the Ultraviolet
  - • 4.4 Objective Prism Spectroscopy
- Chapter 5: Imaging
  - • 5.1 Imaging Overview
  - • 5.2 Optical CCD Imaging
  - • 5.3 Ultraviolet Imaging with the MAMA Detectors
  - • 5.4 Neutral Density Filters
- Chapter 6: Exposure Time Calculations
  - • 6.1 Overview
  - • 6.2 Determining Count Rates from Sensitivities
  - • 6.3 Throughput and Sensitivity
  - • 6.4 Computing Exposure Times
  - • 6.5 Detector and Sky Backgrounds
  - • 6.6 Tabular Sky Backgrounds
  - • 6.7 Extinction Correction
  - • 6.8 Exposure Time Examples
- Chapter 7: Feasibility and Detector Performance
  - • 7.1 STIS Detectors
  - • 7.2 The CCD
  - • 7.3 CCD Operation and Feasibility Considerations
  - • 7.4 The MAMA Detectors
  - • 7.5 MAMA Operation and Feasibility Considerations
  - • 7.6 MAMA Spectral and Spatial Offsetting
  - • 7.7 MAMA Bright Object Limits
- Chapter 8: Target Acquisition
  - • 8.1 Introduction
  - • 8.2 STIS Onboard CCD Target Acquisitions - ACQ
  - • 8.3 Onboard Target Acquisition Peakups - ACQ PEAK
  - • 8.4 Determining Coordinates in the International Celestial Reference System (ICRS) Reference Frame
  - • 8.5 Acquisition Examples
  - • 8.6 STIS Post-Observation Target Acquisition Analysis
- Chapter 9: Overheads and Orbit-Time Determination
  - • 9.1 Overview
  - • 9.2 STIS Exposure Overheads
  - • 9.3 Orbit Use Determination Examples
- Chapter 10: Summary and Checklist
  - • 10.1 Phase I Proposing
  - • 10.2 Phase II - Scheduling Approved Observations
- Chapter 11: Data Taking
  - • 11.1 Basic Operating Modes
  - • 11.2 Exposure Sequences and Contemporaneous Calibrations
  - • 11.3 Patterns and Dithering
  - • 11.4 Fixing Orientation on the Sky
  - • 11.5 Target Positioning
- Chapter 12: Special Uses of STIS
  - • 12.1 Slitless First-Order Spectroscopy
  - • 12.2 Long-Slit Echelle Spectroscopy
  - • 12.3 Time-Resolved Observations
  - • 12.4 Observing Too-Bright Objects with STIS
  - • 12.5 High Signal-to-Noise Ratio Observations
  - • 12.6 Improving the Sampling of the Line Spread Function
  - • 12.7 Considerations for Observing Planetary Targets
  - • 12.8 Special Considerations for Extended Targets
  - • 12.9 Parallel Observing with STIS
  - • 12.10 Coronagraphic Spectroscopy
  - • 12.11 Coronagraphic Imaging - 50CORON
  - • 12.12 Spatial Scans with the STIS CCD
- Chapter 13: Spectroscopic Reference Material
  - • 13.1 Introduction
  - • 13.2 Using the Information in this Chapter
  - 13.3 Gratings
    - • First-Order Grating G750L
    - • First-Order Grating G750M
    - • First-Order Grating G430L
    - • First-Order Grating G430M
    - • First-Order Grating G230LB
    - • Comparison of G230LB and G230L
    - • First-Order Grating G230MB
    - • Comparison of G230MB and G230M
    - • First-Order Grating G230L
    - • First-Order Grating G230M
    - • First-Order Grating G140L
    - • First-Order Grating G140M
    - • Echelle Grating E230M
    - • Echelle Grating E230H
    - • Echelle Grating E140M
    - • Echelle Grating E140H
    - • PRISM
    - • PRISM Wavelength Relationship
  - 13.4 Apertures
    - • 52X0.05 Aperture
    - • 52X0.05E1 and 52X0.05D1 Pseudo-Apertures
    - • 52X0.1 Aperture
    - • 52X0.1E1 and 52X0.1D1 Pseudo-Apertures
    - • 52X0.2 Aperture
    - • 52X0.2E1, 52X0.2E2, and 52X0.2D1 Pseudo-Apertures
    - • 52X0.5 Aperture
    - • 52X0.5E1, 52X0.5E2, and 52X0.5D1 Pseudo-Apertures
    - • 52X2 Aperture
    - • 52X2E1, 52X2E2, and 52X2D1 Pseudo-Apertures
    - • 52X0.2F1 Aperture
    - • 0.2X0.06 Aperture
    - • 0.2X0.2 Aperture
    - • 0.2X0.09 Aperture
    - • 6X0.2 Aperture
    - • 0.1X0.03 Aperture
    - • FP-SPLIT Slits 0.2X0.06FP(A-E) Apertures
    - • FP-SPLIT Slits 0.2X0.2FP(A-E) Apertures
    - • 31X0.05ND(A-C) Apertures
    - • 0.2X0.05ND Aperture
    - • 0.3X0.05ND Aperture
    - • F25NDQ Aperture
  - 13.5 Spatial Profiles
    - • First-Order Spatial Profiles
    - • Echelle Spatial Profiles
  - 13.6 Line Spread Functions
    - • First-Order Line Spread Functions
    - • Echelle Line Spread Functions
  - • 13.7 Spectral Purity, Order Confusion, and Peculiarities
  - • 13.8 MAMA Spectroscopic Bright Object Limits
- Chapter 14: Imaging Reference Material
  - • 14.1 Introduction
  - • 14.2 Using the Information in this Chapter
  - 14.3 CCD
    - • CCD Clear Imaging - 50CCD
    - • CCD Long-Pass Imaging F28X50LP
    - • F28X50OIII - CCD
    - • F28X50OII - CCD
    - • 50CORON - Clear CCD
  - 14.4 NUV-MAMA
    - • 25MAMA - NUV-MAMA, Clear
    - • F25ND3 - NUV-MAMA
    - • F25ND5 - NUV-MAMA
    - • F25NDQ - NUV-MAMA
    - • F25QTZ - NUV-MAMA, Longpass
    - • F25SRF2 - NUV-MAMA, Longpass
    - • F25MGII - NUV-MAMA
    - • F25CN270 - NUV-MAMA
    - • F25CIII - NUV-MAMA
    - • F25CN182 - NUV-MAMA
  - 14.5 FUV-MAMA
    - • 25MAMA - FUV-MAMA, Clear
    - • 25MAMAD1 - FUV-MAMA Pseudo-Aperture
    - • F25ND3 - FUV-MAMA
    - • F25ND5 - FUV-MAMA
    - • F25NDQ - FUV-MAMA
    - • F25QTZ - FUV-MAMA, Longpass
    - • F25QTZD1 - FUV-MAMA, Longpass Pseudo-Aperture
    - • F25SRF2 - FUV-MAMA, Longpass
    - • F25SRF2D1 - FUV-MAMA, Longpass Pseudo-Aperture
    - • F25LYA - FUV-MAMA, Lyman-alpha
  - • 14.6 Image Mode Geometric Distortion
  - • 14.7 Spatial Dependence of the STIS PSF
  - • 14.8 MAMA Imaging Bright Object Limits
- Chapter 15: Overview of Pipeline Calibration
  - • 15.1 Pipeline Processing Overview
  - • 15.2 How Phase II Parameter Choices Affect Calibration
  - • 15.3 More Detailed Information
- Chapter 16: Accuracies
  - • 16.1 Summary of Accuracies
- Chapter 17: Calibration Status and Plans
  - • 17.1 Introduction
  - • 17.2 Ground Testing and Calibration
  - • 17.3 STIS Installation and Verification (SMOV2)
  - • 17.4 Cycle 7 Calibration
  - • 17.5 Cycle 8 Calibration
  - • 17.6 Cycle 9 Calibration
  - • 17.7 Cycle 10 Calibration
  - • 17.8 Cycle 11 Calibration
  - • 17.9 Cycle 12 Calibration
  - • 17.10 SM4 and SMOV4 Calibration
  - • 17.11 Cycle 17 Calibration Plan
  - • 17.12 Cycle 18 Calibration Plan
  - • 17.13 Cycle 19 Calibration Plan
  - • 17.14 Cycle 20 Calibration Plan
  - • 17.15 Cycle 21 Calibration Plan
  - • 17.16 Cycle 22 Calibration Plan
  - • 17.17 Cycle 23 Calibration Plan
  - • 17.18 Cycle 24 Calibration Plan
  - • 17.19 Cycle 25 Calibration Plan
  - • 17.20 Cycle 26 Calibration Plan
  - • 17.21 Cycle 27 Calibration Plan
  - • 17.22 Cycle 28 Calibration Plan
  - • 17.23 Cycle 29 Calibration Plan
  - • 17.24 Cycle 30 Calibration Plan
  - • 17.25 Cycle 31 Calibration Plan
- Appendix A: Available-But-Unsupported Spectroscopic Capabilities
  - • A.1 Introduction
  - • A.2 Full Aperture Complement
  - • A.3: Additional Available-but-Unsupported Options
- • Glossary

52X0.1E1 and 52X0.1D1 Pseudo-Apertures

Description

Special Considerations

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