52X0.5 Aperture

Description

This slit is supported for all first-order gratings and is available-but-unsupported for the echelle gratings. It is a good slit for spectrophotometric observations of point sources.

Special Considerations

Observations using this slit do not need to be preceded by a PEAKUP. Be aware of effects of OTA scatter on the line profiles when observing point sources in wide slits (see Section 13.7). Targets not centered on the slit along the spatial direction can experience significant shifts in wavelength. Use of this long slit with an echelle grating will cause order overlap problems (particularly for the most closely spaced orders; see Section 12.2), but for point sources the order separation may be adequate for many science programs.


Table 13.21: 52X0.5 Throughputs.

λ

% Throughput

1200

83.1

1800

87.9

2400

90.0

3000

91.2

3600

92.1

4200

92.9

4800

93.3

5400

93.4

6000

93.3

6600

93.2

7200

92.9

7800

92.8

8400

93.2


Projected Length (arcsec)


 

Aperture

CCD

MAMA (M-modes)

MAMA (L-modes)

Width (arcsec)

52X0.5

52.0

28.0

25.0

0.5

Figure 13.68: 52X0.5 Aperture Throughput as a Function of Wavelength.