E.20 The Cycle 33 Calibration Plan

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The Cycle 33 calibration plan will be executed from November 2025 through November 2026. The individual programs are listed in Table E.21 and are described in more detail on the WFC3 Calibration Plan webpage. In the Cycle 33 Calibration section, a similar table contains direct links to the Phase II programs and observation dates. This information may alternately be accessed via the HST Program Information webpage by entering the Proposal ID.

The WFC3 Cycle 33 Calibration section also links to a PDF presentation summarizing WFC3 usage in the latest cycle and comparing the current plan with the prior cycle. This document contains more details on the calibration justification and in many cases includes supporting figures with the latest results from regular monitoring.

The Cycle 33 calibration plan is designed to:

  • Maintain and update the standard reference files (biases, darks, linearity, CTE traps, UVIS anomalous QE pixels, post-flash).
  • Monitor the health of the instrument (throughput, gain, hysteresis, bad/hot pixels, sink pixels, CTE decline, stability of the post-flash LED, filter transmission, state of the CSM, number of IR blobs, wavelength and flux stability of the grisms).
  • Support new initiatives and obtain supplemental (non-routine) calibration data.

The results of these calibration programs will be documented in Instrument Science Reports on the WFC3 website at:
http://www.stsci.edu/hst/instrumentation/wfc3/documentation/instrument-science-reports-isrs

Table E.21: The Cycle 32 Calibration Programs

17944WFC3 UVIS Anneal
17945WFC3 UVIS Bowtie Monitor
17946WFC3 UVIS CCD Daily Monitor Part 1
17947WFC3 UVIS CCD Daily Monitor Part 2
17948WFC3 UVIS CCD Daily Monitor Part 3
17949WFC3 UVIS CCD Unflashed (CTE) Monitor
17950WFC3 UVIS Post-flash Monitor
17951WFC3 UVIS CCD Gain Stability
17952WFC3 UVIS CTI Monitor (EPER)
17953WFC3 UVIS CTE Monitor (Star Cluster)
17954WFC3 Characterization of UVIS traps with Charge Injection
17955WFC3 UVIS CTE Internal Monitor
17956WFC3 IR Dark Monitor
17957WFC3 IR Linearity Monitor
17958WFC3 IR Gain Monitor
17959WFC3 UVIS Shutter Monitoring
17960WFC3 UVIS Photometry
17961WFC3 IR Photometry
17962WFC3 UVIS Time Dependent Sensitivity
17963WFC3 IR Time Dependent Sensitivity: Clusters
17964WFC3 IR Time Dependent Sensitivity: Spatial Scans
17965HST Focus and Optical Monitor
17966WFC3 UVIS Grism Wavelength Calibration
17967WFC3 IR Grism Wavelength Calibration
17968WFC3 IR Grism Flux/Trace Monitor
17969WFC3 UVIS Pixel-to-Pixel QE Variations via Internal Flats
17970WFC3 UVIS Internal Flats
17971WFC3 IR Internal Flats
17972WFC3 CSM Monitor with Earth Flats
17973WFC3 UVIS Astrometric Scale Monitoring
17974WFC3 UVIS Astrometric Scale Monitoring
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