E.19 The Cycle 32 Calibration Plan

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The Cycle 32 calibration plan is being executed from November 2024 through October 2025. The individual programs are listed in Table E.20 and are described in more detail on the WFC3 Calibration Plan webpage. In the Cycle 32 Calibration section, a similar table contains direct links to the Phase II programs and observation dates. This information may alternately be accessed via the HST Program Information webpage by entering the Proposal ID.

The WFC3 Cycle 32 Calibration section also links to a PDF presentation summarizing WFC3 usage in the latest cycle and comparing the current plan with the prior cycle. This document contains more details on the calibration justification and in many cases includes supporting figures with the latest results from regular monitoring.

The Cycle 32 calibration plan was designed to:

  • Maintain and update the standard reference files (biases, darks, linearity, CTE traps, UVIS anomalous QE pixels, post-flash).
  • Monitor the health of the instrument (throughput, gain, hysteresis, bad/hot pixels, sink pixels, CTE decline, stability of the post-flash LED, filter transmission, state of the CSM, number of IR blobs, wavelength and flux stability of the grisms).
  • Support new initiatives and obtain supplemental (non-routine) calibration data.

The results of these calibration programs will be documented in Instrument Science Reports on the WFC3 website at:
http://www.stsci.edu/hst/instrumentation/wfc3/documentation/instrument-science-reports-isrs

Table E.20: The Cycle 32 Calibration Programs

17665WFC3 UVIS Anneal
17666WFC3 UVIS Bowtie Monitor
17667WFC3 UVIS CCD Daily Monitor Part 1
17668WFC3 UVIS CCD Daily Monitor Part 2
17669WFC3 UVIS CCD Daily Monitor Part 3
17670WFC3 UVIS CCD Unflashed (CTE) Monitor
17671WFC3 UVIS Post-flash Monitor
17672WFC3 UVIS CCD Gain Stability
17673WFC3 UVIS CTI Monitor (EPER)
17674WFC3 UVIS CTE Monitor (star cluster)
17675WFC3 Characterization of UVIS traps with Charge Injection
17676WFC3 UVIS CTE Internal Monitor
17677WFC3 IR Dark Monitor
17678WFC3 IR Linearity Monitor
17679WFC3 IR Gain Monitor
17680WFC3 UVIS Shutter Monitoring
17681WFC3 UVIS and IR Photometry
17682WFC3 Time Dependent Sensitivity
17683WFC3 IR Time Dependent Sensitivity in Clusters
17684WFC3 IR Time-Dependent Sensitivity: Spatial Scans
17685HST Focus and Optical Monitor
17686WFC3 UVIS Grism Wavelength Calibration
17687WFC3 IR Grism Wavelength Calibration
17688WFC3 IR Flux/Trace Monitor
17689WFC3 UVIS Pixel-to-Pixel QE Variations via Internal Flats
17690WFC3 UVIS Internal Flats
17691WFC3 IR Internal Flats
17692WFC3 CSM Monitor with Earth Flats
17693WFC3 Astrometric Scale Monitoring
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