E.7 The Cycle 20 Calibration Plan
The Cycle 20 calibration plan is summarized in WFC3 ISR 2013-05. It was executed from November 2012 through October 2013.
The calibration programs comprising this plan are listed in Table E.8. The proposals and observation dates can be viewed by entering the Proposal ID into the HST Program Information webpage.
The Cycle 20 calibration plan was designed to:
- continue to maintain and update the standard reference files (biases, darks, linearity, CTE traps)
- continue to monitor the instrument (throughput, gain, hysteresis, bad/hot pixels, filter transmission, IR blobs, grism calibration, CTE decline, stability of post-flash)
- improve photometric precision (CTE correction, IR flat fields, dynamic range)
- improve astrometric precision (spatial scans, DGEO files)
- enhance UV calibration (flat fields, post-flash and CTE correction)
- improve our understanding of IR persistence, IR blobs and the CSM, anomalous QE in CCD pixels
The results of these calibration programs will be documented in Instrument Science Reports on the WFC3 website at:
http://www.stsci.edu/hst/instrumentation/wfc3/documentation/instrument-science-reports-isrs
Table E.8: Cycle 20 Calibration Programs
Proposal ID | Title |
13071 | UVIS Anneal |
13072 | UVIS Bowtie Monitor |
13073 | UVIS CCD Daily Monitor A |
13074 | UVIS CCD Daily Monitor B |
13075 | UVIS CCD Daily Monitor C |
13076 | UVIS CCD Daily Monitor D |
13077 | IR Dark Monitor |
13078 | UVIS Post-Flash Monitor |
13079 | IR Linearity Monitor |
13080 | IR Gain Monitor |
13081 | Guard Dark for MCT Programs |
13082 | UVIS CTI Monitor (EPER) |
13083 | UVIS CTE Monitor (star clusters) |
13084 | Characterization of UVIS Traps with CI |
13085 | Line 10 CI Bias |
13086 | IR Persistence Behaviors as Function of Saturation Time |
13087 | IR Persistence Model Tests |
13088 | WFC3 Contamination & Stability Monitor |
13089 | WFC3 UVIS & IR Photometry |
13090 | UVIS Grism: Flux Calibration |
13091 | UVIS Grism: Wavelength Calibration |
13092 | IR Grisms: Flux Calibration |
13093 | IR Grisms: Wavelength Calibration |
13094 | IR Grism -1 Order Calibration |
13095 | UVIS L-Flat via Spatial Scans |
13096 | UVIS Flat Field Validation |
13097 | UVIS Internal Flats |
13098 | IR Internal Flats |
13099 | IR Earth Flats |
13100 | UVIS & IR Geometric Distortion |
13101 | High Precision Astrometry |
13168 | UVIS CCD Gain Stability |
13169 | CCD Anomalous QE pixels |
13499 | WFC3 Blob Monitor Using Dark-Earth IR Flats |
-
WFC3 Instrument Handbook
- • Acknowledgments
- Chapter 1: Introduction to WFC3
- Chapter 2: WFC3 Instrument Description
- Chapter 3: Choosing the Optimum HST Instrument
- Chapter 4: Designing a Phase I WFC3 Proposal
- Chapter 5: WFC3 Detector Characteristics and Performance
-
Chapter 6: UVIS Imaging with WFC3
- • 6.1 WFC3 UVIS Imaging
- • 6.2 Specifying a UVIS Observation
- • 6.3 UVIS Channel Characteristics
- • 6.4 UVIS Field Geometry
- • 6.5 UVIS Spectral Elements
- • 6.6 UVIS Optical Performance
- • 6.7 UVIS Exposure and Readout
- • 6.8 UVIS Sensitivity
- • 6.9 Charge Transfer Efficiency
- • 6.10 Other Considerations for UVIS Imaging
- • 6.11 UVIS Observing Strategies
- Chapter 7: IR Imaging with WFC3
- Chapter 8: Slitless Spectroscopy with WFC3
-
Chapter 9: WFC3 Exposure-Time Calculation
- • 9.1 Overview
- • 9.2 The WFC3 Exposure Time Calculator - ETC
- • 9.3 Calculating Sensitivities from Tabulated Data
- • 9.4 Count Rates: Imaging
- • 9.5 Count Rates: Slitless Spectroscopy
- • 9.6 Estimating Exposure Times
- • 9.7 Sky Background
- • 9.8 Interstellar Extinction
- • 9.9 Exposure-Time Calculation Examples
- Chapter 10: Overheads and Orbit Time Determinations
-
Appendix A: WFC3 Filter Throughputs
- • A.1 Introduction
-
A.2 Throughputs and Signal-to-Noise Ratio Data
- • UVIS F200LP
- • UVIS F218W
- • UVIS F225W
- • UVIS F275W
- • UVIS F280N
- • UVIS F300X
- • UVIS F336W
- • UVIS F343N
- • UVIS F350LP
- • UVIS F373N
- • UVIS F390M
- • UVIS F390W
- • UVIS F395N
- • UVIS F410M
- • UVIS F438W
- • UVIS F467M
- • UVIS F469N
- • UVIS F475W
- • UVIS F475X
- • UVIS F487N
- • UVIS F502N
- • UVIS F547M
- • UVIS F555W
- • UVIS F600LP
- • UVIS F606W
- • UVIS F621M
- • UVIS F625W
- • UVIS F631N
- • UVIS F645N
- • UVIS F656N
- • UVIS F657N
- • UVIS F658N
- • UVIS F665N
- • UVIS F673N
- • UVIS F680N
- • UVIS F689M
- • UVIS F763M
- • UVIS F775W
- • UVIS F814W
- • UVIS F845M
- • UVIS F850LP
- • UVIS F953N
- • UVIS FQ232N
- • UVIS FQ243N
- • UVIS FQ378N
- • UVIS FQ387N
- • UVIS FQ422M
- • UVIS FQ436N
- • UVIS FQ437N
- • UVIS FQ492N
- • UVIS FQ508N
- • UVIS FQ575N
- • UVIS FQ619N
- • UVIS FQ634N
- • UVIS FQ672N
- • UVIS FQ674N
- • UVIS FQ727N
- • UVIS FQ750N
- • UVIS FQ889N
- • UVIS FQ906N
- • UVIS FQ924N
- • UVIS FQ937N
- • IR F098M
- • IR F105W
- • IR F110W
- • IR F125W
- • IR F126N
- • IR F127M
- • IR F128N
- • IR F130N
- • IR F132N
- • IR F139M
- • IR F140W
- • IR F153M
- • IR F160W
- • IR F164N
- • IR F167N
- Appendix B: Geometric Distortion
- Appendix C: Dithering and Mosaicking
- Appendix D: Bright-Object Constraints and Image Persistence
-
Appendix E: Reduction and Calibration of WFC3 Data
- • E.1 Overview
- • E.2 The STScI Reduction and Calibration Pipeline
- • E.3 The SMOV Calibration Plan
- • E.4 The Cycle 17 Calibration Plan
- • E.5 The Cycle 18 Calibration Plan
- • E.6 The Cycle 19 Calibration Plan
- • E.7 The Cycle 20 Calibration Plan
- • E.8 The Cycle 21 Calibration Plan
- • E.9 The Cycle 22 Calibration Plan
- • E.10 The Cycle 23 Calibration Plan
- • E.11 The Cycle 24 Calibration Plan
- • E.12 The Cycle 25 Calibration Plan
- • E.13 The Cycle 26 Calibration Plan
- • E.14 The Cycle 27 Calibration Plan
- • E.15 The Cycle 28 Calibration Plan
- • E.16 The Cycle 29 Calibration Plan
- • E.17 The Cycle 30 Calibration Plan
- • E.18 The Cycle 31 Calibration Plan
- • E.19 The Cycle 32 Calibration Plan
- • Glossary