E.6 The Cycle 19 Calibration Plan

The Cycle 19 calibration plan was executed from October 2011 through October 2012. It is discussed in WFC3 ISR 2012-04.

The calibration programs comprising this plan are listed in Table E.7. The proposals and observation dates can be viewed by entering the Proposal ID into the HST Program Information webpage.

The Cycle 19 calibration plan was designed to:

continue to maintain and update the standard reference files (biases, darks, IR non-linearity, UVIS and IR geometric distortion table)
monitor the pixel-to-pixel response of both channels and the hysteresis (QE) offset
validate the temporal and spatial photometric performance of the WFC3 channels
characterize and model the persistence effects in the IR detector and verify the temporal behavior
characterize and model the charge transfer efficiency (CTE) in the UVIS channel, including analysis and calibration of the post-flash option
improve the wavelength and flux calibration over the whole detector for all the WFC3 grisms
validate in-flight correction of the flat fields
improve the accuracy of the absolute photometric calibration

The results of these calibration programs are being documented in Instrument Science Reports on the WFC3 website at:
http://www.stsci.edu/hst/instrumentation/wfc3/documentation/instrument-science-reports-isrs

Table E.7: Cycle 19 Calibration Programs

Proposal ID	Title
12687	UVIS Anneal
12688	UVIS Bowtie Monitor
12689	UVIS CCD Daily Monitor
12690	UVIS CCD Gain Stability
12691	UVIS CTI Monitor (EPER)
12692	UVIS CTE Monitor (Star Clusters)
12693	UVIS Charge Injection
12694	IR Persistence Strength
12695	IR Dark Monitor
12696	IR Linearity Monitor
12697	IR Gain Monitor
12698	WFC3 Contamination & Stability Monitor
12699	WFC3 Photometric Calibration & Calibration Flux Ladder
12700	Extending the Range & Precision of the Count Rate non Linearity
12701	WFC3 PSF Wings
12702	IR Grisms: Flux/Trace Calibration & Stability
12703	IR Grisms: Wavelength Calibration & Stability
12704	UVIS Grism: Flux Calibration
12705	UVIS Grism: Wavelength Calibration & Stability
12706	UVIS Flare Wavelength Dependence
12707	UVIS Spatial Sensitivity
12708	IR Spatial Sensitivity
12709	UVIS & IR Moonlit Flats
12710	UVIS Bright Earth Flats
12711	UVIS Internal Flats
12712	IR Internal Flats
12713	Spatial Scanned L-flat Validation Pathfinder
12714	UVIS & IR Geometric Distortion
12784	Characterization of UVIS Traps Via Charge-Injected Biases
12794	Repeatability of High Precision Photometry and Astrometry in Spatially Scanned UVIS Data
12798	Bias, Dark, and Charge Injection (CI) for UVIS Binned mode
12802	WFC3 Post-Flash Characterization
12803	Guard Darks
12808	Characterization of UVIS Pixel-to-Pixel QE Variations Via Internal Flats
13068	WFC3 Blob Monitor Using Dark-Earth IR Flats
13069	WFC3 UVIS Post-Flash Calibration
13103	WFC3/UVIS Anneal
13104	UVIS Bowtie Monitor
13105	Characterization of UVIS Traps Via Charge-Injected Biases

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WFC3 Instrument Handbook
- • Acknowledgments
- Chapter 1: Introduction to WFC3
  - • 1.1 New for Cycle 32
  - • 1.2. Overview
  - • 1.3 Key Features of WFC3
  - • 1.4 WFC3 Quick Reference Guide
  - • 1.5 Special Considerations for Cycle 32
  - • 1.6 Sources of Further Information
  - • 1.7 The WFC3 Instrument Team at STScI
- Chapter 2: WFC3 Instrument Description
- Chapter 3: Choosing the Optimum HST Instrument
- Chapter 4: Designing a Phase I WFC3 Proposal
  - • 4.1 Phase I and Phase II Proposals
  - • 4.2 Preparing a Phase I Proposal
- Chapter 5: WFC3 Detector Characteristics and Performance
- Chapter 6: UVIS Imaging with WFC3
  - • 6.1 WFC3 UVIS Imaging
  - • 6.2 Specifying a UVIS Observation
  - • 6.3 UVIS Channel Characteristics
  - • 6.4 UVIS Field Geometry
  - • 6.5 UVIS Spectral Elements
  - • 6.6 UVIS Optical Performance
  - • 6.7 UVIS Exposure and Readout
  - • 6.8 UVIS Sensitivity
  - • 6.9 Charge Transfer Efficiency
  - • 6.10 Other Considerations for UVIS Imaging
  - • 6.11 UVIS Observing Strategies
- Chapter 7: IR Imaging with WFC3
  - • 7.1 WFC3 IR Imaging
  - • 7.2 Specifying an IR Observation
  - • 7.3 IR Channel Characteristics
  - • 7.4 IR Field Geometry
  - • 7.5 IR Spectral Elements
  - • 7.6 IR Optical Performance
  - • 7.7 IR Exposure and Readout
  - • 7.8 IR Sensitivity
  - • 7.9 Other Considerations for IR Imaging
  - • 7.10 IR Observing Strategies
- Chapter 8: Slitless Spectroscopy with WFC3
- Chapter 9: WFC3 Exposure-Time Calculation
  - • 9.1 Overview
  - • 9.2 The WFC3 Exposure Time Calculator - ETC
  - • 9.3 Calculating Sensitivities from Tabulated Data
  - • 9.4 Count Rates: Imaging
  - • 9.5 Count Rates: Slitless Spectroscopy
  - • 9.6 Estimating Exposure Times
  - • 9.7 Sky Background
  - • 9.8 Interstellar Extinction
  - • 9.9 Exposure-Time Calculation Examples
- Chapter 10: Overheads and Orbit Time Determinations
  - • 10.1 Overview
  - • 10.2 Observatory Overheads
  - • 10.3 Instrument Overheads
  - • 10.4 Orbit Use Examples
- Appendix A: WFC3 Filter Throughputs
  - • A.1 Introduction
  - A.2 Throughputs and Signal-to-Noise Ratio Data
    - • UVIS F200LP
    - • UVIS F218W
    - • UVIS F225W
    - • UVIS F275W
    - • UVIS F280N
    - • UVIS F300X
    - • UVIS F336W
    - • UVIS F343N
    - • UVIS F350LP
    - • UVIS F373N
    - • UVIS F390M
    - • UVIS F390W
    - • UVIS F395N
    - • UVIS F410M
    - • UVIS F438W
    - • UVIS F467M
    - • UVIS F469N
    - • UVIS F475W
    - • UVIS F475X
    - • UVIS F487N
    - • UVIS F502N
    - • UVIS F547M
    - • UVIS F555W
    - • UVIS F600LP
    - • UVIS F606W
    - • UVIS F621M
    - • UVIS F625W
    - • UVIS F631N
    - • UVIS F645N
    - • UVIS F656N
    - • UVIS F657N
    - • UVIS F658N
    - • UVIS F665N
    - • UVIS F673N
    - • UVIS F680N
    - • UVIS F689M
    - • UVIS F763M
    - • UVIS F775W
    - • UVIS F814W
    - • UVIS F845M
    - • UVIS F850LP
    - • UVIS F953N
    - • UVIS FQ232N
    - • UVIS FQ243N
    - • UVIS FQ378N
    - • UVIS FQ387N
    - • UVIS FQ422M
    - • UVIS FQ436N
    - • UVIS FQ437N
    - • UVIS FQ492N
    - • UVIS FQ508N
    - • UVIS FQ575N
    - • UVIS FQ619N
    - • UVIS FQ634N
    - • UVIS FQ672N
    - • UVIS FQ674N
    - • UVIS FQ727N
    - • UVIS FQ750N
    - • UVIS FQ889N
    - • UVIS FQ906N
    - • UVIS FQ924N
    - • UVIS FQ937N
    - • IR F098M
    - • IR F105W
    - • IR F110W
    - • IR F125W
    - • IR F126N
    - • IR F127M
    - • IR F128N
    - • IR F130N
    - • IR F132N
    - • IR F139M
    - • IR F140W
    - • IR F153M
    - • IR F160W
    - • IR F164N
    - • IR F167N
- Appendix B: Geometric Distortion
  - • B.1 Overview
  - • B.2 UVIS Channel
  - • B.3 IR Channel
- Appendix C: Dithering and Mosaicking
  - • C.1 Why Mosaicking and Dithering are Needed
  - • C.2 WFC3 Patterns
- Appendix D: Bright-Object Constraints and Image Persistence
  - • D.1 UVIS Channel
  - • D.2 IR Channel
- Appendix E: Reduction and Calibration of WFC3 Data
  - • E.1 Overview
  - • E.2 The STScI Reduction and Calibration Pipeline
  - • E.3 The SMOV Calibration Plan
  - • E.4 The Cycle 17 Calibration Plan
  - • E.5 The Cycle 18 Calibration Plan
  - • E.6 The Cycle 19 Calibration Plan
  - • E.7 The Cycle 20 Calibration Plan
  - • E.8 The Cycle 21 Calibration Plan
  - • E.9 The Cycle 22 Calibration Plan
  - • E.10 The Cycle 23 Calibration Plan
  - • E.11 The Cycle 24 Calibration Plan
  - • E.12 The Cycle 25 Calibration Plan
  - • E.13 The Cycle 26 Calibration Plan
  - • E.14 The Cycle 27 Calibration Plan
  - • E.15 The Cycle 28 Calibration Plan
  - • E.16 The Cycle 29 Calibration Plan
  - • E.17 The Cycle 30 Calibration Plan
  - • E.18 The Cycle 31 Calibration Plan
- • Glossary

E.6 The Cycle 19 Calibration Plan

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