E.17 The Cycle 30 Calibration Plan
The Cycle 30 calibration plan was executed from November 2022 through October 2023. The individual programs are listed in Table E.18 and are described in more detail on the WFC3 Calibration Plan webpage. Following the link to Cycle 30 Calibration, a similar table may be found with direct links to the phase II programs and observation dates. This information may alternately be accessed via the HST Program Information webpage by entering the Proposal ID.
The WFC3 Cycle 30 section also links to a PDF presentation summarizing WFC3 usage and comparing the Cycle 30 plan with the prior cycle. This document contains more details on the calibration justification and in many cases includes supporting figures with the latest results from regular monitoring.
The Cycle 30 calibration plan was designed to:
- Maintain and update the standard reference files (biases, darks, linearity, CTE traps, UVIS anomalous QE pixels, post-flash)
- Monitor the health of the instrument (throughput, gain, hysteresis, bad/hot pixels, sink pixels, CTE decline, stability of the post-flash LED, filter transmission, state of the CSM, number of IR blobs, wavelength and flux stability of the grisms)
- Support new initiatives and obtain supplemental (non-routine) calibration data
Four new calibration programs will supplement the standard monitoring. These programs (17261, 17262, 17265, 17271) were designed to:
- Track any changes in the IR sensitivity using repeated scan mode observations of M35
- Measure the non-repeatability of the mechanical shutter using repeated short exposures of a bright spectrophotometric standard with the UVIS grism
- Provide users with faint-source CTE-loss curves for backgrounds between 30 e- and 100 e-
- Investigate the UVIS EE and PSF spatial structure at radii greater than 150 pixels using saturated exposures of a white dwarf standard
The results of these calibration programs will be documented in Instrument Science Reports on the WFC3 website at:
http://www.stsci.edu/hst/instrumentation/wfc3/documentation/instrument-science-reports-isrs
Table E.18: The Cycle 30 Calibration Programs
ID | Program |
---|---|
16967 | WFC3 UVIS Anneal |
16982 | WFC3 UVIS Post-flash Monitor |
17002 | WFC3 UVIS Bowtie Monitor |
17003 | WFC3 UVIS CCD Daily Monitor Part 1 |
17004 | WFC3 UVIS CCD Daily Monitor Part 2 |
17005 | WFC3 UVIS CCD Daily Monitor Part 3 |
17006 | WFC3 UVIS CCD Unflashed (CTE) Monitor |
17007 | WFC3 UVIS CCD Gain Stability |
17008 | WFC3 UVIS CTI Monitor (EPER) |
17009 | WFC3 UVIS CTE Monitor (star cluster) |
17010 | WFC3 Characterization of UVIS traps with Charge Injection |
17011 | WFC3 IR Dark Monitor |
17012 | WFC3 IR Linearity Monitor |
17013 | WFC3 IR Gain Monitor |
17014 | WFC3 UVIS Shutter Monitoring |
17015 | WFC3 UVIS and IR Photometry |
17016 | WFC3 Time Dependent Sensitivity |
17017 | WFC3 IR Wavelength Calibration |
17018 | WFC3 IR Flux/Trace Monitor |
17019 | WFC3 UVIS Pixel-to-Pixel QE Variations via Internal Flats |
17020 | WFC3 UVIS Internal Flats |
17021 | WFC3 IR Internal Flats |
17022 | WFC3 CSM Monitor with Earth Flats |
17023 | WFC3 Astrometric Scale Monitoring |
17258 | HST Cycle 30 Focus & Optical Monitor |
17259 | WFC3 UVIS CTE Internal Monitor |
17260 | WFC3 IR Time-Dependent Sensitivity: Clusters |
17261 | WFC3 IR Time-Dependent Sensitivity: Scans |
17262 | WFC3 UVIS Faint-Source CTE Characterization |
17265 | WFC3 Shutter Timing Jitter and FLASH with UVIS grism |
17271 | WFC3 UVIS Deep PSFs |
-
WFC3 Instrument Handbook
- • Acknowledgments
- Chapter 1: Introduction to WFC3
- Chapter 2: WFC3 Instrument Description
- Chapter 3: Choosing the Optimum HST Instrument
- Chapter 4: Designing a Phase I WFC3 Proposal
- Chapter 5: WFC3 Detector Characteristics and Performance
-
Chapter 6: UVIS Imaging with WFC3
- • 6.1 WFC3 UVIS Imaging
- • 6.2 Specifying a UVIS Observation
- • 6.3 UVIS Channel Characteristics
- • 6.4 UVIS Field Geometry
- • 6.5 UVIS Spectral Elements
- • 6.6 UVIS Optical Performance
- • 6.7 UVIS Exposure and Readout
- • 6.8 UVIS Sensitivity
- • 6.9 Charge Transfer Efficiency
- • 6.10 Other Considerations for UVIS Imaging
- • 6.11 UVIS Observing Strategies
- Chapter 7: IR Imaging with WFC3
- Chapter 8: Slitless Spectroscopy with WFC3
-
Chapter 9: WFC3 Exposure-Time Calculation
- • 9.1 Overview
- • 9.2 The WFC3 Exposure Time Calculator - ETC
- • 9.3 Calculating Sensitivities from Tabulated Data
- • 9.4 Count Rates: Imaging
- • 9.5 Count Rates: Slitless Spectroscopy
- • 9.6 Estimating Exposure Times
- • 9.7 Sky Background
- • 9.8 Interstellar Extinction
- • 9.9 Exposure-Time Calculation Examples
- Chapter 10: Overheads and Orbit Time Determinations
-
Appendix A: WFC3 Filter Throughputs
- • A.1 Introduction
-
A.2 Throughputs and Signal-to-Noise Ratio Data
- • UVIS F200LP
- • UVIS F218W
- • UVIS F225W
- • UVIS F275W
- • UVIS F280N
- • UVIS F300X
- • UVIS F336W
- • UVIS F343N
- • UVIS F350LP
- • UVIS F373N
- • UVIS F390M
- • UVIS F390W
- • UVIS F395N
- • UVIS F410M
- • UVIS F438W
- • UVIS F467M
- • UVIS F469N
- • UVIS F475W
- • UVIS F475X
- • UVIS F487N
- • UVIS F502N
- • UVIS F547M
- • UVIS F555W
- • UVIS F600LP
- • UVIS F606W
- • UVIS F621M
- • UVIS F625W
- • UVIS F631N
- • UVIS F645N
- • UVIS F656N
- • UVIS F657N
- • UVIS F658N
- • UVIS F665N
- • UVIS F673N
- • UVIS F680N
- • UVIS F689M
- • UVIS F763M
- • UVIS F775W
- • UVIS F814W
- • UVIS F845M
- • UVIS F850LP
- • UVIS F953N
- • UVIS FQ232N
- • UVIS FQ243N
- • UVIS FQ378N
- • UVIS FQ387N
- • UVIS FQ422M
- • UVIS FQ436N
- • UVIS FQ437N
- • UVIS FQ492N
- • UVIS FQ508N
- • UVIS FQ575N
- • UVIS FQ619N
- • UVIS FQ634N
- • UVIS FQ672N
- • UVIS FQ674N
- • UVIS FQ727N
- • UVIS FQ750N
- • UVIS FQ889N
- • UVIS FQ906N
- • UVIS FQ924N
- • UVIS FQ937N
- • IR F098M
- • IR F105W
- • IR F110W
- • IR F125W
- • IR F126N
- • IR F127M
- • IR F128N
- • IR F130N
- • IR F132N
- • IR F139M
- • IR F140W
- • IR F153M
- • IR F160W
- • IR F164N
- • IR F167N
- Appendix B: Geometric Distortion
- Appendix C: Dithering and Mosaicking
- Appendix D: Bright-Object Constraints and Image Persistence
-
Appendix E: Reduction and Calibration of WFC3 Data
- • E.1 Overview
- • E.2 The STScI Reduction and Calibration Pipeline
- • E.3 The SMOV Calibration Plan
- • E.4 The Cycle 17 Calibration Plan
- • E.5 The Cycle 18 Calibration Plan
- • E.6 The Cycle 19 Calibration Plan
- • E.7 The Cycle 20 Calibration Plan
- • E.8 The Cycle 21 Calibration Plan
- • E.9 The Cycle 22 Calibration Plan
- • E.10 The Cycle 23 Calibration Plan
- • E.11 The Cycle 24 Calibration Plan
- • E.12 The Cycle 25 Calibration Plan
- • E.13 The Cycle 26 Calibration Plan
- • E.14 The Cycle 27 Calibration Plan
- • E.15 The Cycle 28 Calibration Plan
- • E.16 The Cycle 29 Calibration Plan
- • E.17 The Cycle 30 Calibration Plan
- • E.18 The Cycle 31 Calibration Plan
- • E.19 The Cycle 32 Calibration Plan
- • Glossary