E.3 The SMOV Calibration Plan
The Servicing Mission Observatory Verification (SMOV) plan for WFC3 was executed following the instrument's successful installation in HST in May, 2009. The calibration plan consisted of engineering, alignment, and calibration activities whose principal goal was to verify that the instrument would be ready for science at the beginning of Cycle 17 in August, 2009. WFC3’s SMOV activities began on 25 May 2009 with the Activation Test. The first set of SMOV imaging data were acquired on 11 June 2009, and the last in the first week of September. Because of the short duration, only a critical subset of WFC3’s imaging and spectroscopic modes were calibrated. All of the 44 activities are presented in Table E.4. The proposals and observation dates can be viewed by entering the Proposal ID into the HST Program Information webpage. Most of these activities have an associated Instrument Science Report, published in 2009 with the proposal number in the title, and are available on the WFC3 website at:
https://www.stsci.edu/hst/instrumentation/wfc3/documentation/instrument-science-reports-isrs.
Table E.4: SMOV4 Calibration Programs.
Proposal ID | Title |
11454 | Activation Test |
11357 | Memory Test |
11358 | Sci Data Buffer Test |
N/A | UVIS CCD Cooldown |
N/A | IR Detector Cooldown |
11419 | UVIS Det Functional |
11420 | IR Det Functional |
11421 | CSM Test |
11422 | UVIS SOFA Test |
11529 | UVIS Spare Tungsten Lamp |
11423 | IR FSM Test |
11543 | IR Spare Tungsten Lamp |
11424 | UVIS Initial Alignment |
11425 | IR Initial Alignment |
11426 | UVIS Contam Monitor |
11427 | UVIS Shutter Test |
11428 | D2 Cal Lamp Test |
N/A | UVIS TEC Performance |
N/A | IR TEC Performance |
11431 | UVIS Hot Pixel Anneal |
11432 | UVIS Int Flats |
11433 | IR Int Flats |
11434 | UVIS Fine Alignment |
11435 | IR Fine Alignment |
11436 | UVIS Image Quality |
11437 | IR Image Quality |
11438 | UVIS PSF Wings |
11439 | IR PSF Wings |
11549 | UVIS & IR Pointing Stability |
11442 | FGS-UVIS Update |
11443 | FGS-IR Update |
11444 | UVIS Plate Scale |
11445 | IR Plate Scale |
11446 | UVIS Dark, Noise, Backgnd |
11447 | IR Dark, Noise, Backgnd |
11448 | UVIS SAA Passage |
11449 | IR SAA Passage |
11450 | UVIS Phot Zero Points |
11451 | IR Phot Zero Points |
11452 | UVIS Flat Field Uniformity |
11453 | IR Flat Field Uniformity |
11552 | IR Grisms |
11798 | UVIS PSF Core Modulation |
11808 | UVIS Bowtie Monitor |
-
WFC3 Instrument Handbook
- • Acknowledgments
- Chapter 1: Introduction to WFC3
- Chapter 2: WFC3 Instrument Description
- Chapter 3: Choosing the Optimum HST Instrument
- Chapter 4: Designing a Phase I WFC3 Proposal
- Chapter 5: WFC3 Detector Characteristics and Performance
-
Chapter 6: UVIS Imaging with WFC3
- • 6.1 WFC3 UVIS Imaging
- • 6.2 Specifying a UVIS Observation
- • 6.3 UVIS Channel Characteristics
- • 6.4 UVIS Field Geometry
- • 6.5 UVIS Spectral Elements
- • 6.6 UVIS Optical Performance
- • 6.7 UVIS Exposure and Readout
- • 6.8 UVIS Sensitivity
- • 6.9 Charge Transfer Efficiency
- • 6.10 Other Considerations for UVIS Imaging
- • 6.11 UVIS Observing Strategies
- Chapter 7: IR Imaging with WFC3
- Chapter 8: Slitless Spectroscopy with WFC3
-
Chapter 9: WFC3 Exposure-Time Calculation
- • 9.1 Overview
- • 9.2 The WFC3 Exposure Time Calculator - ETC
- • 9.3 Calculating Sensitivities from Tabulated Data
- • 9.4 Count Rates: Imaging
- • 9.5 Count Rates: Slitless Spectroscopy
- • 9.6 Estimating Exposure Times
- • 9.7 Sky Background
- • 9.8 Interstellar Extinction
- • 9.9 Exposure-Time Calculation Examples
- Chapter 10: Overheads and Orbit Time Determinations
-
Appendix A: WFC3 Filter Throughputs
- • A.1 Introduction
-
A.2 Throughputs and Signal-to-Noise Ratio Data
- • UVIS F200LP
- • UVIS F218W
- • UVIS F225W
- • UVIS F275W
- • UVIS F280N
- • UVIS F300X
- • UVIS F336W
- • UVIS F343N
- • UVIS F350LP
- • UVIS F373N
- • UVIS F390M
- • UVIS F390W
- • UVIS F395N
- • UVIS F410M
- • UVIS F438W
- • UVIS F467M
- • UVIS F469N
- • UVIS F475W
- • UVIS F475X
- • UVIS F487N
- • UVIS F502N
- • UVIS F547M
- • UVIS F555W
- • UVIS F600LP
- • UVIS F606W
- • UVIS F621M
- • UVIS F625W
- • UVIS F631N
- • UVIS F645N
- • UVIS F656N
- • UVIS F657N
- • UVIS F658N
- • UVIS F665N
- • UVIS F673N
- • UVIS F680N
- • UVIS F689M
- • UVIS F763M
- • UVIS F775W
- • UVIS F814W
- • UVIS F845M
- • UVIS F850LP
- • UVIS F953N
- • UVIS FQ232N
- • UVIS FQ243N
- • UVIS FQ378N
- • UVIS FQ387N
- • UVIS FQ422M
- • UVIS FQ436N
- • UVIS FQ437N
- • UVIS FQ492N
- • UVIS FQ508N
- • UVIS FQ575N
- • UVIS FQ619N
- • UVIS FQ634N
- • UVIS FQ672N
- • UVIS FQ674N
- • UVIS FQ727N
- • UVIS FQ750N
- • UVIS FQ889N
- • UVIS FQ906N
- • UVIS FQ924N
- • UVIS FQ937N
- • IR F098M
- • IR F105W
- • IR F110W
- • IR F125W
- • IR F126N
- • IR F127M
- • IR F128N
- • IR F130N
- • IR F132N
- • IR F139M
- • IR F140W
- • IR F153M
- • IR F160W
- • IR F164N
- • IR F167N
- Appendix B: Geometric Distortion
- Appendix C: Dithering and Mosaicking
- Appendix D: Bright-Object Constraints and Image Persistence
-
Appendix E: Reduction and Calibration of WFC3 Data
- • E.1 Overview
- • E.2 The STScI Reduction and Calibration Pipeline
- • E.3 The SMOV Calibration Plan
- • E.4 The Cycle 17 Calibration Plan
- • E.5 The Cycle 18 Calibration Plan
- • E.6 The Cycle 19 Calibration Plan
- • E.7 The Cycle 20 Calibration Plan
- • E.8 The Cycle 21 Calibration Plan
- • E.9 The Cycle 22 Calibration Plan
- • E.10 The Cycle 23 Calibration Plan
- • E.11 The Cycle 24 Calibration Plan
- • E.12 The Cycle 25 Calibration Plan
- • E.13 The Cycle 26 Calibration Plan
- • E.14 The Cycle 27 Calibration Plan
- • E.15 The Cycle 28 Calibration Plan
- • E.16 The Cycle 29 Calibration Plan
- • E.17 The Cycle 30 Calibration Plan
- • E.18 The Cycle 31 Calibration Plan
- • Glossary