9.2 The WFC3 Exposure Time Calculator - ETC
In most cases, you will find it convenient to use the online WFC3 Exposure Time Calculator (ETC) to make estimates of the required exposure times for your project.
The ETC calculates counts (e–) and count rates (e–/s) for input source and background parameters and assumed characteristics of the detectors. Once these are entered, the ETC then outputs signal-to-noise ratios (SNRs) achieved for a given exposure time, or the exposure times required to achieve a given SNR The ETC supports both direct-imaging and spectroscopic (grism) observations. Starting in 2016 (Cycle 24), the ETC supports spatial scanning for UVIS and IR imaging and IR spectroscopy (WFC3 STAN issue 22). A variety of circular and square extraction apertures are available in the ETC, allowing the user to select either a radius in arcseconds or a size in pixels. It is also possible to input a calibrated spectral-energy distribution (SED) of your source directly into the ETC. The ETC also outputs peak per-pixel count rates and total count rates, to aid in feasibility assessment. Warnings will appear if the source will saturate the detector, which would not only compromise CCD and IR observations, but might even affect subsequent exposures with the IR channel (Appendix D). The ETC has online help for its execution and interpretation of results.
There are some items worth noting:
- For the UVIS channel, the ETC uses a CCD full-well value of 63,000 e–, the minimum value for either CCD chip, to determine saturation; users wishing to strictly avoid this occurrence should allow a buffer of at least 10% below this. (Section 5.4.5 presents a discussion of saturation.)
- For the UVIS channel, to the extent possible, one should select Detector chip 2 for UV filter exposures and place the target on chip 2 (e.g., aperture UVIS2 in Figure 6.1 or the subarray apertures in the lower left quadrant of Figure 6.2) since chip 2 has better quantum efficiency than chip 1 (Figure 5.2). Note, however, that the quad filters have quadrant-dependent passbands as specified in Table 13.5 in Section 13.4.1 of the Phase II Proposal Instructions. The user should be careful to select the Detector chip corresponding to the relevant quadrant for a given filter name, since the ETC will incorrectly allow either chip to be selected. (Quads A and B are on chip 1; quads C and D are on chip 2.)
- To mitigate CTE losses, observers can add background to UVIS exposures by using the post-flash option (Section 6.9.2). See Section 9.6 for equations that show how the post-flash background affects the calculation of SNR and exposure time.
- For the IR channel, when the # of Frames = 1, the ETC assumes a complete timing sequence (NSAMP = 15). For smaller NSAMP, the read noise is greater (Section 5.7.3). For most programs, NSAMP should be greater than 5, and ideally more if possible, to achieve the best readnoise and cosmic ray correction (Section 7.10.3).
- The He I airglow line at 10,830 Angstroms is being added as a component of the IR sky background for Cycle 24 and beyond (Section 7.9.5). It only contributes to the background observed in the F105W and F110W filters and the G102 and G141 grisms. The default ETC value of “None” will provide ETC estimates unchanged from those of previous cycles. The other available options---Average, High, Very High---are the 50%, 75% and 95% percentile values of the excess background, per exposure, observed over the value estimated for the zodiacal light alone (e.g., Figure 7.12). Determined from an analysis of archival exposures, these percentiles correspond to an additional 0.1, 0.5, and 1.5 e-/s, respectively, normalized in the F105W filter. Note that the “Average” value of 0.5 e-/s is comparable to the flux predicted for the zodiacal background (Figure 7.12). Furthermore, achieving the He I value of “None” is essentially only possible if the SHADOW special requirement is used, though this is not recommended as the available usable orbit duration is then dramatically reduced; it is almost always preferable to keep observing even in the presence of elevated backgrounds for part of the orbit (WFC3 ISR 2014-03).
It is also possible to use stsynphot
to calculate count rates and the wavelength distribution of detected counts.
The remaining sections of this chapter give detailed information on the sensitivities of the UVIS and IR channels when combined with the various spectral elements, and the use of this information in the determination of count rates, for those who wish to understand the subject in depth.
-
WFC3 Instrument Handbook
- • Acknowledgments
- Chapter 1: Introduction to WFC3
- Chapter 2: WFC3 Instrument Description
- Chapter 3: Choosing the Optimum HST Instrument
- Chapter 4: Designing a Phase I WFC3 Proposal
- Chapter 5: WFC3 Detector Characteristics and Performance
-
Chapter 6: UVIS Imaging with WFC3
- • 6.1 WFC3 UVIS Imaging
- • 6.2 Specifying a UVIS Observation
- • 6.3 UVIS Channel Characteristics
- • 6.4 UVIS Field Geometry
- • 6.5 UVIS Spectral Elements
- • 6.6 UVIS Optical Performance
- • 6.7 UVIS Exposure and Readout
- • 6.8 UVIS Sensitivity
- • 6.9 Charge Transfer Efficiency
- • 6.10 Other Considerations for UVIS Imaging
- • 6.11 UVIS Observing Strategies
- Chapter 7: IR Imaging with WFC3
- Chapter 8: Slitless Spectroscopy with WFC3
-
Chapter 9: WFC3 Exposure-Time Calculation
- • 9.1 Overview
- • 9.2 The WFC3 Exposure Time Calculator - ETC
- • 9.3 Calculating Sensitivities from Tabulated Data
- • 9.4 Count Rates: Imaging
- • 9.5 Count Rates: Slitless Spectroscopy
- • 9.6 Estimating Exposure Times
- • 9.7 Sky Background
- • 9.8 Interstellar Extinction
- • 9.9 Exposure-Time Calculation Examples
- Chapter 10: Overheads and Orbit Time Determinations
-
Appendix A: WFC3 Filter Throughputs
- • A.1 Introduction
-
A.2 Throughputs and Signal-to-Noise Ratio Data
- • UVIS F200LP
- • UVIS F218W
- • UVIS F225W
- • UVIS F275W
- • UVIS F280N
- • UVIS F300X
- • UVIS F336W
- • UVIS F343N
- • UVIS F350LP
- • UVIS F373N
- • UVIS F390M
- • UVIS F390W
- • UVIS F395N
- • UVIS F410M
- • UVIS F438W
- • UVIS F467M
- • UVIS F469N
- • UVIS F475W
- • UVIS F475X
- • UVIS F487N
- • UVIS F502N
- • UVIS F547M
- • UVIS F555W
- • UVIS F600LP
- • UVIS F606W
- • UVIS F621M
- • UVIS F625W
- • UVIS F631N
- • UVIS F645N
- • UVIS F656N
- • UVIS F657N
- • UVIS F658N
- • UVIS F665N
- • UVIS F673N
- • UVIS F680N
- • UVIS F689M
- • UVIS F763M
- • UVIS F775W
- • UVIS F814W
- • UVIS F845M
- • UVIS F850LP
- • UVIS F953N
- • UVIS FQ232N
- • UVIS FQ243N
- • UVIS FQ378N
- • UVIS FQ387N
- • UVIS FQ422M
- • UVIS FQ436N
- • UVIS FQ437N
- • UVIS FQ492N
- • UVIS FQ508N
- • UVIS FQ575N
- • UVIS FQ619N
- • UVIS FQ634N
- • UVIS FQ672N
- • UVIS FQ674N
- • UVIS FQ727N
- • UVIS FQ750N
- • UVIS FQ889N
- • UVIS FQ906N
- • UVIS FQ924N
- • UVIS FQ937N
- • IR F098M
- • IR F105W
- • IR F110W
- • IR F125W
- • IR F126N
- • IR F127M
- • IR F128N
- • IR F130N
- • IR F132N
- • IR F139M
- • IR F140W
- • IR F153M
- • IR F160W
- • IR F164N
- • IR F167N
- Appendix B: Geometric Distortion
- Appendix C: Dithering and Mosaicking
- Appendix D: Bright-Object Constraints and Image Persistence
-
Appendix E: Reduction and Calibration of WFC3 Data
- • E.1 Overview
- • E.2 The STScI Reduction and Calibration Pipeline
- • E.3 The SMOV Calibration Plan
- • E.4 The Cycle 17 Calibration Plan
- • E.5 The Cycle 18 Calibration Plan
- • E.6 The Cycle 19 Calibration Plan
- • E.7 The Cycle 20 Calibration Plan
- • E.8 The Cycle 21 Calibration Plan
- • E.9 The Cycle 22 Calibration Plan
- • E.10 The Cycle 23 Calibration Plan
- • E.11 The Cycle 24 Calibration Plan
- • E.12 The Cycle 25 Calibration Plan
- • E.13 The Cycle 26 Calibration Plan
- • E.14 The Cycle 27 Calibration Plan
- • E.15 The Cycle 28 Calibration Plan
- • E.16 The Cycle 29 Calibration Plan
- • E.17 The Cycle 30 Calibration Plan
- • E.18 The Cycle 31 Calibration Plan
- • Glossary